Aberration-corrected STEM/TEM imaging at 15 kV

Resolving 45 pm with 300 kV Aberration Corrected STEM

Eternal challenge towards better resolution has been running by scientists who pursue to see smaller scale world, and countless efforts were spent since the microscope was invented. Within recent decades, Cs corrected microscope [1-3] realized sub-angstrom resolution [4,5]. And further resolution, sub-50-pm was demonstrated in dark-field STEM at 300 kV with an aberration corrected microscope us...

Application of 80-200 kV Aberration Corrected Dedicated STEM With Cold FEG

Aberration corrected emittance exchange

The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Full exploitation of emittance exchange (EEX) requires aberration-free performance of a complex imaging system including active radio-frequency (rf) elements which can add temporal distortions. We investigate the performance of an EEX line where the exchange occurs between two ...

Pupil-phase optimization for extended-focus, aberration-corrected imaging systems

The insertion of a suitably designed phase plate in the pupil of an imaging system makes it possible to encode the depth dimension of an extended three-dimensional scene by means of an approximately shift-invariant PSF. The so-encoded image can then be deblurred digitally by standard image recovery algorithms to recoup the depth dependent detail of the original scene. A similar strategy can be ...

fast multicolor 3 d imaging using aberration - corrected multifocus microscopy

60 | VOL.10 NO.1 | JANUARY 2013 | nature methods fluorescence microscopy using beam splitters to image up to four focal planes on separate cameras3. This method provides excellent light efficiency and a large lateral field of view corresponding to the entire surface area of the camera chip. However, refocusing by translating the camera away from the nominal focal plane induces spherical aberrat...